THE INFLUENCE OF MECHANICAL DEFORMATION ON THE PROPERTIES OF FILMS (BI 0.25 SB 0.75 ) 2 TE 3

Authors

  • Siddiqov Rustamjon O'ktamovich
  • Akbarov Adham Axadovich Kokand branch of Tashkent State Technical University named after Islam Karimov

Keywords:

semiconductor, cyclic deformation, voltage drop, strain gauge, strain sensitivity, current-voltage characteristic .

Abstract

The article presents discussions about the influence of cyclic deformations on the current-voltage characteristics of (Bi 0.25 Sb 0.75 ) 2 Te 3 films and the use of strain gauges for measuring mechanical quantities.

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Published

2024-05-29

How to Cite

Siddiqov Rustamjon O’ktamovich, & Akbarov Adham Axadovich. (2024). THE INFLUENCE OF MECHANICAL DEFORMATION ON THE PROPERTIES OF FILMS (BI 0.25 SB 0.75 ) 2 TE 3. Intent Research Scientific Journal, 3(5), 44–49. Retrieved from https://intentresearch.org/index.php/irsj/article/view/329

Issue

Vol. 3 No. 5 (2024): IRSJ

Section

Articles

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